Dislocation Characterization using Weak Beam Dark Field STEM Imaging
نویسندگان
چکیده
منابع مشابه
”Optimisation” of imaging conditions for weak beam studies of dislocation core structures in Ti3Al
The imaging conditions for weak beam (WB) studies of dislocations in Ti3AI with intermediate voltage transmission electron microscopes have been derived following a theoretical examination of the traditional criteria for WB-microscopy. The cores of <2c+a>-dislocations in room temperature deformed Ti3AI have been characterised in a case study with 300kV electrons by experimental WB-microscopy, w...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618011492